In this paper, an improved method, diagonal slice spectrum analysis, is presented and used to characterize the asymmetry and coupling of the rough surface.
本文提出了一种改进的对角线切片谱分析方法，并把它用于粗糙表面轮廓的非线性和耦合性特征分析。
The ameliorated method of diagonal slice spectrum analysis is presented and used to characterize the skewness and phase coupling of the rough surface profiles.
本文提出了一种改进的对角线切片谱分析方法，并把它用于粗糙表面轮廓的非线性和耦合性特征分析。
The ameliorated method of diagonal slice spectrum analysis is presented and used to characterize the skewness and phase coupling of the rough surface profiles.
本文提出了一种改进的对角线切片谱分析方法，并把它用于粗糙表面轮廓的非线性和耦合性特征分析。
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