Then, the films were characterized with X ray photoelectron spectroscopy(XPS), X ray diffraction(XRD), ultraviolet visible light absorption spectroscopy, and atomic force microscopy(AFM).
用X光电子能谱、X射线衍射、紫外可见吸收光谱、原子力显微镜等手段对制备的薄膜进行了表征。
The x-ray diffraction (XRD), x-ray photoelectron spectroscopy (XPS)and scanning electronic microscopy (SEM)were employed to analyze the structure, composition and surface morphology of the films .
用x射线衍射（XRD）、扫描电镜（SEM）和x光电子能谱（XPS）对样品进行了结构、形貌及组分分析。
X-ray photoelectron spectroscopy and X-ray diffraction were used to analyze the chemical structure of the DLC films containing ti.
通过X射线光电子能谱及X射线衍射表征了薄膜的化学结构。
The elementary composition of PANI-SnP composite films in reduced and oxidized form were also characterized by energy dispersive X-ray spectroscopy (EDS) and X-ray photoelectron spectroscopy (XPS).
通过X射线能谱仪（EDS）和X射线光电子能谱（XPS）分别测定了复合膜在氧化和还原状态下的元素组成。
Specific frequency used by inductively coupled plasma emission spectroscopy, X-ray diffraction, Raman spectroscopy, X-ray photoelectron spectroscopy, cyclic voltammetry methods.
具体采用了电感耦合高频等离子体发射光谱、X射线衍射、拉曼光谱、X射线光电子能谱、循环伏安测试手段。
The changes of surface composition of bisphenol A polysulphonefilms induced by X ray in ultrahigh vacuum have been studied using X ray photoelectron spectroscopy (XPS).
利用X射线光电子能谱（ XPS）研究了双酚A型聚砜薄膜在超高真空下X射线辐照所引起的表面化学组成变化。
We utilized the electrochemistry, scanning electron micrograph, X-ray fluorescence spectroscopy and X-ray photoelectron spectroscopy to demonstrate this mechanism.
我们用电化学方法、扫描电镜、X射线光电子能谱和X射线荧光光谱法对此进行了证明。
The prepared product was characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscope (TEM) and X-ray photoelectron spectroscopy (XPS).
利用X射线衍射(XRD)、扫描电镜(sem)、透射电镜(tem)和X射线光电子能谱(XPS)对制备的产品进行了表征。
The coating phase structure and chemical composition were analyzed by X-ray Diffraction (XRD) and X-ray Photoelectron Spectroscopy (XPS) respectively;
利用X射线衍射仪、X射线光电子能谱仪（XPS）对涂层的相结构及涂层的化学成分进行了分析和讨论；
The obtained products were characterized by X-ray powder diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and scanning electron microscopy (SEM).
合成产物用粉未衍射（XRD）X-射线光电子能谱（XPS）和扫描电子显微（SEM）表征。
The obtained products were characterized by X-ray powder diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and scanning electron microscopy (SEM).
合成产物用粉未衍射（XRD）X-射线光电子能谱（XPS）和扫描电子显微（SEM）表征。
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