Compiling VCD to ATE recognized Patterns is an essential work to develop semiconductor test program.
在半导体测试程序开发中如何快速有效地进行VCD -模式的编译是一项重要的课题。
The utility model relates to a semiconductor test device, in particular to a semiconductor test probe.
本实用新型涉及一种半导体测试器件，尤其是半导体测试探针。
They now also offer a final test handler for packaged devices and test floor management software as part of their strategy to be a comprehensive semiconductor test solutions provider.
致力成为一家综合的半导体测试解决方案供应商，是Electroglas重要的战略目标之一，因此伊智也为器件封装提供后道测试机械手和测试台管理软件。
Moreover, in order to clean the semiconductor test probe, the probe module group as a whole, due to the special structure of the tail part of the probe, can be placed into an ultrasonic cleaner.
而且如果使用本半导体测试探针，由于针尾部的特殊结构，我们可以将整个针模组放入超声波清洗机中清洗。
Performance test of semiconductor detector based personal dosimeter was made for personal dose monitoring purpose.
本文报道了用于个人剂量监测的半导体探测器个人剂量计及其性能测试。
According to the test result on the site, the system offers high stability and accurate temperature control. It satisfies the requirements of semiconductor production.
从现场测试结果看，系统有较好的稳定性和高精度的温度控制，满足了半导体行业的生产要求。
An automated test system for semiconductor gas sensors is constructed in this thesis.
本文组建了一套用于半导体气体传感器的自动测试系统。
The sensor is widely used in every aspect of production and life, and semiconductor piezoresistive sensor has become the main role in the modern test due to its good performance.
传感器在生产和生活的各个方面应用广泛，而半导体压阻式传感器以其优越的性能成为现代测试领域的主角。
And initial results have been obtained in the field of the application of combining microelectronic test structure with quality control theory to semiconductor technology.
将微电子测试结构与质量管理理论结合起来，运用于半导体技术，取得了初步结果。
The main factors affecting the quality of semiconductor heterostructure epitaxy chips, inspection methods and some typical test results have beeen introduced in this pater.
本文介绍了影响半导体异质外延晶片质量的主要因素，检测方法，几个典型测试结果。
Besides, the test board which is used for testing the semiconductor arrester's breakover voltage is designed.
另外，对于半导体放电管转折电压的测试，设计出相应的转折电压测试板，并完成调试。
Based on the thermoelectric refrigeration principle and PID parameter self-tuning control technique, a temperature controller for semiconductor laser's environment test is designed.
基于热电制冷原理和PID参数自整定理论，本论文设计了一种半导体激光器环境的温度控制仪。
NBTI testing is a critical reliability test for modern semiconductor processes.
NBTI测试是现代半导体工艺的一个关键的可靠性测试。
The other one USES some conventional testing method to test the facet temperature of the semiconductor lasers.
另一类是利用一些常规的测量技术，测量半导体激光器的腔面温度的分布。
Voltage metering method, electric test method and device, and method for mfg. semiconductor device and device substrate.
电压测量方法，电测试方法和装置，半导体器件制造方法和器件衬底制造方法。
The semiconductor devices are transferred among the test tray, the buffer tray and the customer tray by first and second picker systems.
通过第一及第二拾取器系统在该测试盘、该缓冲盘及该用户盘之间传送该半导体器件。
Amkor helped make these visions a reality by pioneering the outsourcing of semiconductor assembly and test services.
安靠率先通过外包半导体封装和测试服务方式使这些幻想变成现实。
Test of memory faces enormous challenge because of the semiconductor technology progress.
集成电路工艺的改进使存储器的测试面临着更大的挑战。
The steady state thermal resistance has important influence on the life test by researching the discrete semiconductor devices.
在进行相关分立器件分析时发现，稳态热阻对功率器件寿命试验结果影响较大。
In this article, we used the first method to test the stable thermal resistance, and we introduced some testing methods to test the parameters of semiconductor lasers.
本文主要利用第一类方法，对半导体激光器阵列的稳态热阻进行测量，并详细介绍了半导体激光器各个参数的测量方法。
A test chip is designed and manufactured in a semiconductor foundry to test the layout dependency of the electroplating process.
本文设计了一款测试芯片并在一家半导体厂加工制造。
A test chip is designed and manufactured in a semiconductor foundry to test the layout dependency of the electroplating process.
本文设计了一款测试芯片并在一家半导体厂加工制造。
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