• The invention discloses a scan chain fault diagnosis system, a method and a diagnosis vector generating device.

    发明公开了扫描故障诊断系统方法诊断向量生成装置

    ip.com

  • An optimal sequencing of the storage elements in the single scan chain design for - testability is presented in the paper.

    本文提出了扫描设计存储元件扫描中的排序方法。

    dict.cnki.net

  • To resolve them, two design methods of board level dynamic BS chain based on boundary scan technology are proposed in this paper.

    为了解决上述问题文中提出了两种基于边界扫描技术动态链路设计方法

    dict.cnki.net

  • By using pipeline shadow registers and special data path in debug interface circuit, scan chain is no longer needed to insert in the critical path of CPU to facilitate non-intrusive debug capability.

    通过采用调试接口电路流水线映像寄存器组特殊数据通路,可以避免CPU关键路径插入扫描实现“非侵入性”的调试功能

    www.dictall.com

  • For a fixed set of test vectors, the overall test time can be minimized using the scan chain constructed with this method.

    对于确定测试向量集方法构造扫描使电路总的测试时间最少

    dict.cnki.net

  • At sometime, just one scan chain or some of the scan chains are active. Average power is reduced.

    某些时刻,仅有一个或者一部分扫描活跃的,从而电路的平均功耗和总功耗降低

    danci.911cha.com

  • For a fixed set of test vectors, the overall test time can be minimized using the scan chain constructed by this method.

    对于确定测试向量集方法构造扫描使电路总的测试时间最少

    dict.cnki.net

  • Scan chain partition improves diagnosis resolutions by solving controllability problems and observability problems.

    扫描分割技术可借解决可控制性问题可观察性问题来改善诊断解析度

    dict.cn

  • A scan test scheme based on scan chain disabling technique has been proposed, which can effectively reduce test power. However, its test application time is long.

    一种基于扫描阻塞技术扫描测试结构出来,结构有效降低测试功耗测试应用时间

    www.fabiao.net

  • Lastly, the clock speed of the bus feeding scan chain data to the pins of the DUT is increased by multiplexing the scan chain data being transferred to the bus.

    最后通过多路传送传输总线扫描数据,可以提高输送扫描数据DUT总线时钟速度

    www.sinopat.org

  • The invention discloses a memorizer test device based on a scan chain and a use method thereof.

    发明公开了一种基于扫描存储器测试装置及其使用方法

    www.bogu6688.com

  • For the test application time can be reduced effectively, this paper proposes an approach based on scan chain disabling technique, in view of incompatible test vector compression method.

    进一步降低测试功耗及测试应用时间提出基于扫描阻塞技术针对相容测试向量压缩方法

    www.ecice06.com

  • For the test application time can be reduced effectively, this paper proposes an approach based on scan chain disabling technique, in view of incompatible test vector compression method.

    进一步降低测试功耗及测试应用时间提出基于扫描阻塞技术针对相容测试向量压缩方法

    www.ecice06.com

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