The essential principle of Rutherford backscattering analysis is explained briefly.
对卢瑟福背散射分析的基本原理作了概要的介绍。
The conditions of forming tungsten silicide with As ion beam mixing have been studied by means of Rutherford backscattering.
本工作用卢瑟福背散射研究了离子束混合方法形成硅化钨的条件。
The distribution of rare earth ions embedded into porous silicon films was observed by Rutherford backscattering spectrometry.
用卢瑟福背散射谱分析了稀土离子在多孔硅薄膜中的分布情况。
Weighing, a-particle measurement, Rutherford backscattering and spectrophotometer are used to determine the thickness of carbon foils.
碳膜厚度测量方法包括称重法、背散射法、等效空气法和吸光光度法。
The structure and composition of samples were analysed by Rutherford backscattering spectroscopy (RBS), X-ray diffraction (XRD) and Raman spectra.
用卢瑟福背散射、X 射线衍射和喇曼光谱法分析样品的成份及结构。
Rutherford backscattering spectrometry (RBS) demonstrates that the concentration of Fe or N atoms varies gradually from the substrate to the surface through the whole thickness of the films.
卢瑟福背散射分析结果表明，铁、氮两种原子的密度沿膜厚度方向呈梯度变化。
Rutherford backscattering spectrometry (RBS) demonstrates that the concentration of Fe or N atoms varies gradually from the substrate to the surface through the whole thickness of the films.
卢瑟福背散射分析结果表明，铁、氮两种原子的密度沿膜厚度方向呈梯度变化。
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