This paper describes the working principle and structure design of a laser probe ion source which is composed of an x-y-z manipulated sample holder, an optical system and an ion optical system.
本文介绍一种由三维样品调节器、光学系统和离子光学系统组成的激光探针离子源的工作原理与结构设计。
Probe array used for the measurement of transient RF impedance in ion cyclotron resonance heating (ICRH) experiment often gives erroneous results.
在离子回旋共振加热(ICRH)实验中用于测量瞬态射频(RF)阻抗的探针列阵常常给出错误的结果。
An experiment was conducted to study the high-temperature annealing characteristics of polysilicon films using atomic force microscope, secondary ion mass spectroscopy and probe.
利用原子力显微镜、二次离子质谱分析仪和探针，对多晶硅薄膜的高温退火特性进行了实验研究。
The Langmuir double probe system based on Virtual Instrument was used to diagnose arc ion plating plasmas.
本文利用基于虚拟仪器的朗缪尔双探针系统对电弧离子镀等离子体进行了诊断研究。
The acquisition of field emission negative ion and its time-of-flight Spectra (TOPS) brings up to negative ion atom probe invention.
场致发射负离子及其飞行时间谱的获得导致场致发射负离子原子探针的发明。
As a new kind of scanning probe microscopy, scanning ion conductance microscopy (SICM) is designed for imaging non-conducting biological sample at the nanometer scale.
扫描离子电导显微镜技术是在纳米尺度进行非导电的生物样品成像的一种新型扫描探针显微镜技术。
The characteristic of spatial distribution of plasma ion density in reaction chamber were diagnosed by a Langmuir double probe, and the effect of Ar pressure and RF power were also investigated.
利用朗缪尔静电双探针诊断了蒸发镀膜装置反应室内等离子体密度及分析其分布规律，并分析了气压和功率对等离子体分布的影响。
The trajectories of the negative ions in the negative ion atom probe have been calculated for hyperboloidal tip shape.
本文基于双曲面形样品针尖，计算了负离子原子探针中负离子的飞行轨迹。
Objective to probe into the issues as seeking, ion, and application of biological evidence when a court doctor inspected the scene.
目的探讨法医现场勘查时生物物证的发现、提取和应用等问题。
Langmuir probe, as a simple and ideal technology, is used to measure many plasma parameters including plasma spatial potential, electron temperature, electron density, ion density and so on.
通过伸入放电室中的Langmuir探针，可以测量包括等离子体电位、电子温度、电子密度、离子密度在内的许多表征等离子体的重要参数。
The electron temperature and ion density were measured by a floating double-probe.
用静电悬浮双探针测量了电子温度和离子温度。
If there was a problem with the chip, you could probe the metal directly to watch the circuitry, and, with a focused-ion-beam system, you could even rewire it.
如果芯片有问题，应该直接研究金属层来察看电路，而对于聚焦离子束系统则应该重新布线。
If there was a problem with the chip, you could probe the metal directly to watch the circuitry, and, with a focused-ion-beam system, you could even rewire it.
如果芯片有问题，应该直接研究金属层来察看电路，而对于聚焦离子束系统则应该重新布线。
应用推荐