The measurement results of complex dielectric constants of low loss and thin flake materials, conductivity and nonequilibrium charge carrier lifetime of semiconductor are introduced.

介绍了测量片状小损耗介质介电常数、半导体电导率及非平衡载流子寿命等参数的结果。

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The measurement results of complex dielectric constants of low loss and thin flake materials, conductivity and nonequilibrium charge carrier lifetime of semiconductor are introduced.

介绍了测量片状小损耗介质介电常数、半导体电导率及非平衡载流子寿命等参数的结果。

youdao