Considering the polarized direction of the beam, the relationship between the radiation force and the polarized direction of the beam for different incidence Angle is analyzed too.
考虑波束极化方向，分析了不同入射方向时辐射俘获力与极化角度之间的关系。
The measurement accuracy of electron beam by using semiconductor detector is easily affected by beam energy, dose rate, beam incidence direction, environment temperature etc.
电子束半导体探测器的测量精度易受到射线的能量、剂量率、入射方向和环境温度等条件的影响。
The measurement accuracy of electron beam by using semiconductor detector is easily affected by beam energy, dose rate, beam incidence direction, environment temperature etc.
电子束半导体探测器的测量精度易受到射线的能量、剂量率、入射方向和环境温度等条件的影响。
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