The resistivity temperature curves of MgB2 wires were measured by standard four-probe method.
采用标准四引线法测定了样品的电阻温度曲线。
The contact resistance between the composite plates and carbon paper were measured with a four-probe method.
通过四电极法测量了复合板与碳纸间的接触电阻。
The thin film TE material resistivity measurement system which is designed in the thesis bases on the principle of four-probe method and double pulse technology.
本论文依据四探针法的基本原理并结合双脉冲技术，设计并制造适用于薄膜温差电材料的电阻率测试系统。
During the method testing inside the class, the testing points are divided into four kinds and the installation of each probe function which matches the location is discussed.
进行类内方法测试时，将测试点分为四种，并分别论述适用于每种测试点位置的探针函数的设置。
In this paper, a simple method to measure the specific contact resistance of metal-semiconductor ohmic contact is developed, using the probe heads of the inline four probes.
本文提出一种用直线四探针头测量金属-半导体欧姆接触接触电阻率的简捷方法。
As with the four-point collinear probe method, a differential measurement may be required if the sample resistance is of the same magnitude as the isolation (meter common to ground) of the voltmeter.
与四点同线探针法一样，如果样品电阻和电压表的绝缘电阻（电压表的公共端到地）是同一数量级的，就可能需要使用差分测量。
The method to make four point probe instrument is provided.
并提供了自制四探针测量仪的方法。
A new method for measuring sheet resistance of semiconductor using four-point probe has been developed.
本文介绍用四探针技术测量半导体薄层电阻的新方案。
A new method for measuring sheet resistance of semiconductor using four-point probe has been developed.
本文介绍用四探针技术测量半导体薄层电阻的新方案。
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