• Nodular defects, which are in critical state of damage, are cross-sectioned by focusing on the ion beam and by imaging using a field emission scanning electron microscope.

    采用聚焦离子束发射扫描电镜处于临界破坏状态缺陷做剖面分析和观察。

    youdao

  • Nodular defects, which are in critical state of damage, are cross-sectioned by focusing on the ion beam and by imaging using a field emission scanning electron microscope.

    采用聚焦离子束发射扫描电镜处于临界破坏状态缺陷做剖面分析和观察。

    youdao

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