The microstructure, morphology and components of the oxide film are characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM) and energy disperse spectroscopy (EDS).
采用扫描电子显微镜(sem)、能谱仪(EDS)、X射线衍射仪(XRD)等仪器研究了氧化膜的形貌、组成和相结构。
The microstructure, morphology and components of the oxide film are characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM) and energy disperse spectroscopy (EDS).
采用扫描电子显微镜(sem)、能谱仪(EDS)、X射线衍射仪(XRD)等仪器研究了氧化膜的形貌、组成和相结构。
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