• A formula of depletion layer width is also deduced.

    导出了两方法耗尽宽度公式

    youdao

  • In this paper, the area contact model of depletion layer width under avalanche breakdown in Si epitaxial wafer by a three-probe method is analysed. The theory accords with experimental results.

    本文分析了三探针测试外延片中雪崩击穿时耗尽宽度接触模型理论实验结果吻合

    youdao

  • In this paper, the area contact model of depletion layer width under avalanche breakdown in Si epitaxial wafer by a three-probe method is analysed. The theory accords with experimental results.

    本文分析了三探针测试外延片中雪崩击穿时耗尽宽度接触模型理论实验结果吻合

    youdao

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