This paper analyses the difficulty in potentiometers' Contact Resistance Variation (CRV) test, and introduces an effective test method-Qarsi-Envelope test method (QETM).
本文分析了电位器接触电阻变化率(CRV)测量的难点，提出了一种行之有效的方法——准包络测量法。
In addition the material physical parameter variation with temperature was considered in the model. The contact resistance and flash melt were considered in the electric-heat coupling model;
模型中考虑了电、热、力的耦合以及材料物性参数随温度的变化，在电热耦合模型中计入接触电阻与闪光烧损对产热过程的影响；
In addition the material physical parameter variation with temperature was considered in the model. The contact resistance and flash melt were considered in the electric-heat coupling model;
模型中考虑了电、热、力的耦合以及材料物性参数随温度的变化，在电热耦合模型中计入接触电阻与闪光烧损对产热过程的影响；
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