A new method for determining directly trace component in interfering base by absorbance division-multi-wavelength linear regression spectrophotometry.
提出了用除谱-多波长线性回归分光光度法测定强干扰基体中微量组分的原理和实验方法。
A new method for determining directly trace component in interfering base by absorbance division-multi-wavelength linear regression spectrophotometry.
提出了用除谱-多波长线性回归分光光度法测定强干扰基体中微量组分的原理和实验方法。
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