实验上，我们采用全像微影术、电浆蚀刻以及旋镀铁氟龙的方式来制作试片，并量测该试片的反射频谱和接触角。
We fabricate desired structured surfaces by holographic lithography, plasma etching and Teflon coating. The performance is evaluated by measuring the reflectance spectrum and contact angle.
该方法可用于能够产生规则傅里叶变换频谱的所有被测物体的几何量。
This method can be used to measure similar objects with the regular Fourier transform spectrum (FTS).
该方法可用于能够产生规则傅里叶变换频谱的所有被测物体的几何量。
This method can be used to measure similar objects with the regular Fourier transform spectrum (FTS).
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