本文主要是对大规模、超大规模集成电路寄存器传输级（RTL）的自动测试产生算法进行研究。
This dissertation focuses on automatic test generation (ATPG) algorithms for very large-scale integrated circuits at register-transfer-level (RTL).
验证是当前越来越复杂的集成电路设计中的瓶颈，在寄存器传输级（RTL）直接做验证是目前比较有效的一种途径。
Verification is the bottleneck of more and more complex integrated circuit designs, and doing verification directly on register transfer level (RTL) is a promising solution.
集成电路设计在寄存器传输级的设计方法已经非常成熟。
双向移位寄存器是一种中规模集成电路，可构成移位寄存器型计数器。
Bidirectional shift register is a kind of medium-scale integrated circuits, it can be used to compose various counters conveniently.
分析了CMOS逻辑门电路在运行时的电流特征，阐明了集成电路中数据与电磁辐射的相关性，建立了寄存器级电磁信息泄漏汉明距离模型。
The result shows that EM information leakage exists in CMOS integrated circuit during work, XOR operation in each round of DES is an attack point.
一种集成电路，包括多个逻辑元件(LE)和一个部分扫描寄存器，每个逻辑元件具有多个输出。
An integrated circuit is described as comprising a plurality of logic elements (LEs), each of which having a plurality of outputs, and a partial scan register.
为了节省读出集成电路所占的面积，采用静态移位寄存器。
In order to save the area of registers, the static or dynamic shift registers are used.
为了节省读出集成电路所占的面积，采用静态移位寄存器。
In order to save the area of registers, the static or dynamic shift registers are used.
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