本文还利用X -射线衍射仪，透射电镜等测试手段，探讨了有机、无机稀释剂对含蒙脱石瓷砂泥浆的稀释机理。
The diluting mechanism of organic and inorganic diluents for porcelain clay containing montmorillonite slip have been explored by X-Ray Diffractometer and Transmission Electron Microscope.
用X射线衍射（XRD）、扫描电镜（SEM）、高分辨率透射电镜（HRTEM）和光致发光光谱（PL）对生成的产物进行了分析。
X ray diffraction (XRD), scanning electron microscopy (SEM), high resolution transmission electron microscopy (HRTEM), and photoluminescence (PL) are used to analyze the synthesized GaN nanorods.
测定了九龙高岭土的可塑性、化学组成、粒度及其分布、白度等，并且做了X—射线和透射电子显微镜分析。
The plasticity, chemical composition, particle size and its distribution, whiteness and so on of jiulong kaolin were measured and analyzed by X-ray and TEM.
利用透射电镜、X射线光电子能谱及拉曼光谱等分析手段对该膜进行了显微结构分析，发现类金刚石膜是含有金刚石及其它碳相的混合碳膜。
Using TEM, XPS and Raman spectroscopy, we analysed the microstructure of the DLC films. It was found that DLC films were mixed carbon films containing diamond and other carbon phase.
利用X射线衍射(XRD)、透射电子显微镜(TEM)、高分辨电子显微镜(H RTEM)研究了碳纤维的微观结构。
The microstructure of carbon fibers has been studied using X-ray diffractometer (XRD), transmission electron microscope (TEM) and high-resolution transmission electron microscope (HRTEM).
采用小角X射线衍射和高分辨率透射电镜研究了不同酸根离子对产物介孔结构的影响。
The effects of acid counteranions on the mesophases were investigated by X-ray diffraction and high-resolution transmission electron microscope.
射线衍射和透射电子显微镜实验不但证实它的非晶性，而且给出它的平均颗粒度大小和晶化产物。
X-ray diffraction and transmission electron microscope experiments indicate the powder sample is amorphous and also show the average particle size and crystallization products.
实验采用了内转换电子谱、X射线散射谱及透射谱的测量。
The methods used include the internal conversion electron spectroscopy, the X ray scattering spectroscopy and conventional transmission Mossbauer spectroscopy.
这些结果将十分有益于大气环境下的软X射线接触显微术及软X射线扫描透射显微术的研究。
These should be very useful to the soft X ray contact microscopy in air and the soft X ray scanning transmission microscopy.
用X射线衍射（XRD）、透射电子显微镜（TEM）等技术研究了PAN基碳纤维在单电流脉冲作用下的结构变化。
The structural change of PAN based carbon fibre by an electric current pulse was studied by means of X-ray diffraction(XRD) and transmission electron microscopy(TEM).
据此即可分别推导出透射中间点和折射点的一阶修正公式，进行折射线逐段迭代计算求出整条射线路径。
Accordingly, the first-order modified formula for transmitted intermediate points and refracted points is derived and whole ray-path can be computed for refracted ray iteratively segment by segment.
同时，用X射线衍射(XRD)、原子力显微电镜(afm)和透射电镜(TEM)对薄膜的微观结构进行了分析。
In addition, the microstructure of the MgO thin films were examined with X-ray diffraction (XRD), Atomic Force Morphology (AFM) and Transmission Electron Micrograph (TEM).
采用X射线衍射（XRD）、透射电子显微镜（TEM）分析手段对样品的物相、结构、形貌进行了表征和分析。
The sample's crystal phase, structure, morphology and the reaction process were characterized and analyzed by using X-ray diffraction(XRD), transmission electron microscopy(TEM).
利用带有针孔的透射式光栅光谱仪研究了激光等离子体X射线辐射的原子序数依赖性和激光功率密度对辐射的影响。
This paper presents the studies of the dependence of soft X-ray emission on atomic-number and laser intensities by using a new diagnostic tool, pinhole transmission grating spectrograph (PTGS).
利用透射电镜(TEM)、扫描电镜(sem)和X射线衍射仪(XRD)等分析技术，表征了等离子喷涂氧化锆涂层的显微结构。
The microstructure of zirconia coating deposited by plasma spraying technique was studied by means of FESEM, SEM, TEM and XRD.
通过X射线粉末衍射（XRD）、扫描电镜（SEM）、透射电镜（TEM）以及荧光光谱对获得的试样进行了表征。
X-ray powder diffraction(XRD), scanning electron microscopy(SEM), transmission electron microscopy(TEM) and photoluminescence spectra were used to characterize the resulted BAM phosphor.
利用透射电子显微镜、X射线衍射仪、扫描电子显微镜和X射线能量色散谱仪分析了多层膜的微结构。
The microstructure of multilayers was characterized by high-resolution transmission electron microscopy, X-ray diffraction, scanning electron microscope and energy dispersive spectrometer.
文中分别得出了透射线及多次衍射线功率的表达式以及有效线吸收系数。
Separate expressions for the transmitted, and multiply diffracted power are obtained, which enable the effective absorption coefficient to be calculated.
利用扫描电子显微镜(sem)、透射电子显微镜(tem)和X射线光电子谱(XPS)对样品的形貌、结构及组份进行表征。
Scanning electron microscopy (SEM), transmission electron microscopy (TEM) and X-ray photoelectron spectroscopy (XPS) were used to evaluate the structure and composition.
采用X射线衍射和透射电子显微镜研究了试样的显微结构。
The microstructure was investigated by X-ray diffraction and TEM analysis.
它基于低能X射线透射的衰减原理。
It is based on the attenuation principle of low energy X-ray transmission.
产物经X射线衍射，水的等温吸附、差热分析、红外图谱，透射电镜以及化学分析等测定证实为L型沸石。
All the samples obtained were examined with X-ray diffraction, isothermal adsorption of water, DTA, TG, IR, TEM, and chemical analysis, and were identified as L-type molecular sieve.
利用透射电镜（TEM）、X射线衍射（XRD）、X射线光电子谱，表征了金纳米粉末的结构、形貌及其化学组分。
Their structure, morphology and components have been characterized using transmission electron microscope(TEM), X-rays diffraction(XRD), and X-rays photoelectron spectrometer(XPS).
本文利用透射电镜和X -射线衍射技术，对酸雨危害较为严重的重庆市市区大气颗粒物样品进行了较力细致的研究工作。
Transmission electron microscope and X-ray diffraction were used to study airborne particulates collected in Chongqing, Sichuan Province, which are seriously damaged by acid rain.
用X射线衍射仪、光学金相显微镜、透射电镜和扫描电镜研究了磁体的结构； 用磁强自动记录仪测量了磁体的退磁曲线。
The structure of the magnet was investigated by XRD, optical microscope, TEM and SEM, and its demagnetization curve was tested by magnetograph.
利用扫描电镜（SEM）、透射电镜（TEM）和X射线衍射（XRD）等技术分析研究了表面层的微观结构特征。
The substructure morphology and characteristics of the treated region was examined by SEM, TEM and XRD technique.
这两种多层膜经透射电子显微镜和小角X射线衍射测量证明构成多层膜的单层膜上的纳米金颗粒是有序的，并且颗粒在层与层之间的排列也是有序的。
The two multilayers had ordered particles both on planes and in layer by layer, which were confirmed by TEM images and small-angle X-ray diffraction measurement.
利用核磁共振仪、扩展X射线吸收精细结构分析、透射电镜对溶胶中的锐钛矿晶体进行深入分析，并考察了锐钛矿晶体的光催化活性。
Nuclear magnetic resonance (NMR) imaging, X-ray absorption fine structure (XAFS) analysis, transmission electron microscope (TEM), and photocatalytic property testing were carried out.
用透射电子显微镜、X射线衍射仪表征样品的形貌和结构。
X-ray diffraction and transmission electron micros-copy were used for the characterization of the structure and morphology of the obtained products.
采用红外光谱、X射线衍射和透射电镜对涂层的组成和结构进行了分析。
The structure and component of coating were analyzed by FTIR spectra, X ray diffraction (XRD) and transmission electron microscopy (TEM).
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