透射电子显微镜方法的研究显示了两种衬底上纳米硅晶粒的尺寸。

Transmission electron microscopy study shows the sizes of nc-Si grains on the two different substrates.

youdao

透射电子显微镜方法的研究显示了两种衬底上纳米硅晶粒的尺寸。

Transmission electron microscopy study shows the sizes of nc-Si grains on the two different substrates.

youdao