本文提出了产生数字电路测试码的一种算法——主路径敏化法。
This paper presents an algorithm of test patterns generation for digital circuits which is called the principal path sensitization method.
本文提出了产生数字电路测试码的一种算法——主路径敏化法。
This paper presents an algorithm of test patterns generation for digital circuits which is called the principal path sensitization method.
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