本文报道了应力测量专用中子衍射谱仪的部分模拟和优化工作。
A part of the simulation and optimization results on the Neutron Diffractometer for Strain Measurements is introduced in this paper.
运用能谱技术（EDXA）、X射线衍射仪（XRD）、扫描电子显微镜（SEM）和图像分析仪对涂层成分、显微组织、涂层相结构和组成进行了分析。
The coating composition, microstructure and phases were investigated by energy dispersive X ray analysis (EDXA), X ray diffraction(XRD), scanning electron microscope(SEM)and image analyzer.
使用扫描电镜（SEM）、X射线衍射（XRD）、X射线能量色散谱仪（EDAX）、显微硬度仪等设备检验了涂层的组织和性能。
The microstructure and mechanic performances of the coating were tested by SEM, XRD, EDAX, microhardness tester and other equipments.
使用X射线光电子能谱仪(XPS)、X射线衍射仪(XRD)、原子力显微镜(afm)对薄膜的结构进行了分析。
The structural properties of the films were analyzed by X ray photo electron spectroscopy (XPS), X ray diffractometer (XRD) and atomic force microscope (AFM).
利用透射电子显微镜、X射线衍射仪、扫描电子显微镜和X射线能量色散谱仪分析了多层膜的微结构。
The microstructure of multilayers was characterized by high-resolution transmission electron microscopy, X-ray diffraction, scanning electron microscope and energy dispersive spectrometer.
用X射线衍射仪检测了样品的结构，测量了样品的阻抗谱和电子顺磁共振谱。
The structures of the samples were analyzed by X-ray diffraction, and the impedance spectra and electron paramagnetic resonance spectra were measured.
产品通过X射线衍射(XRD)、扫描电镜(sem)、能谱仪(EDS)测试，说明块料直接煅烧法生产的方石英具有转化率高、加工性能好、成本低等特点。
By tests of XRD, SEM, EDS, this processing technology has the advantages of high transformation, good processing capability and lower pay out and so on.
使用扫描电镜、能谱仪、X射线衍射仪，对广西六种典型花岗岩所含元素、石英相结构及微观形貌进行了测试分析。
The elements, phase structure of quartz and micro-morphology of six types of granite in Guangxi were analyzed by SEM, EDX XRD.
报道一种利用象差校正平场全息凹面衍射光栅作为分光和成象元件的平场多色仪，该多色仪具有谱面平直、使用波段宽、集光本领强、体积小等优点。
In this paper, the flat field polychromator (SPD - I) using an aberration - corrected flat fie1d holographic concave diffraction grating as both spectroscopic and oPtical imaging element is re-POrted.
采用扫描电子显微镜(sem)、能谱仪(EDS)、X射线衍射仪(XRD)等仪器研究了氧化膜的形貌、组成和相结构。
The microstructure, morphology and components of the oxide film are characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM) and energy disperse spectroscopy (EDS).
采用光学显微镜、扫描电子显微镜、能谱和X射线衍射仪分析了梯度材料各层及界面微观组织、相组成和元素分布。
The microstructure and phase composition of each layer as well as component distribution of elements across the interfaces of the layers were analyzed by means of OM, SEM, EDS and XRD.
应用x射线能谱仪和x射线衍射仪分别对腐蚀产物及管表面宏观残余应力进行定量分析。
Quantitative analyses have been made on the composition of corroded products and the macro-residual stress on the pipe surface by EDX and XRD.
用热分析、X射线衍射仪、扫描电镜、X射线能谱等技术对制备的粉体、烧结前后的中空纤维膜进行了表征。
The prepared powders and the green and sintered hollow-fiber membranes were characterized by thermal analysis, X-ray diffraction, scanning electron microscopy and X-ray energy dispersive spectroscopy.
用扫描电镜、能谱仪和X射线衍射仪分别分析了涂层的形貌、化学成分和相组成。
The morphology, composition and structure of the coating were investigated by scanning electron microscopy, energy dispersive spectrometer and X-ray diffractometer.
利用扫描电镜、能谱仪、X射线衍射等法对熔 覆合金层、合金 层与 钢基体的结合界面等进行了显微组织及相结构的分析。
The microstructure and phase constitution of the coat and the boundary between coat and substrate were studied with SEM, EDX and X-ray analysis techniques.
用X射线粉末衍射仪(XRD)、场发射扫描电镜(FE - sem)和X射线能谱仪(EDX)对产物进行了表征。
The X-ray powder diffraction (XRD), field emission scanning electron microscopy (FE-SEM) and energy dispersive X-ray spectrometer (EDX) were used to characterize the products.
X射线衍射仪、电子能谱仪、原子力显微镜和椭圆偏振仪等研究薄膜的击穿电压、介电常数、晶体结构、化学成分、表面形貌及薄膜的折射率。
The breakdown voltage, permittivity, crystal structure, composition, surface and refractive index of the thin films were studied by I-V, C-V, XRD, EDS, AFM and elliptical polarization instrument.
利用X射线衍射仪、X射线光电子能谱仪（XPS）对涂层的相结构及涂层的化学成分进行了分析和讨论；
The coating phase structure and chemical composition were analyzed by X-ray Diffraction (XRD) and X-ray Photoelectron Spectroscopy (XPS) respectively;
利用X射线衍射仪、X射线光电子能谱仪（XPS）对涂层的相结构及涂层的化学成分进行了分析和讨论；
The coating phase structure and chemical composition were analyzed by X-ray Diffraction (XRD) and X-ray Photoelectron Spectroscopy (XPS) respectively;
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