失效分析是验证测试的重要方面，它为探求芯片失效机理与优化验证测试流程奠定了基础。
Failure analysis is a main aspect of the validation test and it provides the fundamental ways for tracing the failure mechanisms and optimizing the validation test flow.
失效分析是验证测试的重要方面，它为探求芯片失效机理与优化验证测试流程奠定了基础。
Failure analysis is a main aspect of the validation test and it provides the fundamental ways for tracing the failure mechanisms and optimizing the validation test flow.
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