本文主要是对大规模、超大规模集成电路寄存器传输级（RTL）的自动测试产生算法进行研究。

This dissertation focuses on automatic test generation (ATPG) algorithms for very large-scale integrated circuits at register-transfer-level (RTL).

youdao

本文主要是对大规模、超大规模集成电路寄存器传输级（RTL）的自动测试产生算法进行研究。

This dissertation focuses on automatic test generation (ATPG) algorithms for very large-scale integrated circuits at register-transfer-level (RTL).

youdao