序列是一类具有最长周期的非线性移位寄存器序列。
M sequences are the longest nonlinear shift register sequences.
本文研究的模型包括线性移位寄存器序列，前馈序列和钟控序列。
The models studied in this paper include linear shift register sequences, feedforward sequences and clock controlled sequences.
传统的线性移位寄存器序列具有递推性，导致密文抗攻击能力不强。
A traditional linear feedback successive-displacement register (LFSR) random sequence has recurrence character generally, so it makes the ability of anti-attacking of encrypted files poor.
文中首先对线性移位寄存器序列和混沌序列做了阐述，并对其主要性能做了计算。
At first, this thesis expounds linear-shift-register sequence and chaotic sequence, and calculates the value of their main properties.
该生成器抗熵漏攻击的能力与生成器中所用的线性移位寄存器的长度和生成器中组合函数的非线性度有关。
The capability against the Entropy Leak Attack is also related to the nonlinearity of the combination function used in the generator.
因此，我们可以通过使用尽可能大的线性移位寄存器和非线性度高的组合函数来提高该生成器抗攻击的能力。
So, this generator can improve the capability of resisting the above attacks, by using large line Feedback Shift Registers and the combination functions with higher nonlinearity.
本文给出了有限域上多项式的友矩阵的某些性质，及其在计算线性移位寄存器序列的周期和循环码的最小长度的应用。
This paper gives some properties of companion matrix of polynomial over finite field with its application for evaluating period of linear shift register sequence and minimal length of cyclic code.
通过改变线性反馈移位寄存器的结构滤掉无效的测试矢量从而实现低功耗测试。
For low power consumption during test mode, the proposed approach ignores the non detecting vectors by altering the structure of LFSR.
这些多项式是从原始多项式导出的，该原始多项式定义了能够生成伪随机数的线性反馈移位寄存器的反馈函数。
The polynomials are derived from an original polynomial, which defines a feedback function of a linear feedback shift register capable for generating the pseudo random number.
本文介绍了一种使用非最长周期序列的非定长线性反馈移位寄存器作为数字系统内部测试生成器的方案，并给出了设计这种测试生成器的设计过程和算法。
In this paper, a scheme is presented, in which an infinite length's LFSR with non maximum cycle sequence is used as a built-in test generator in digital systems.
本文提出了一种基于受控线性反馈移位寄存器（LFSR）进行内建自测试的结构及其测试矢量生成方法。
A new BIST structure with the method of test vector generation based on a controlled LFSR is proposed.
初步的实验结果表明，从8至24级的线性反馈移位寄存器都可以由1至7级的线性反馈移位寄存器链接构成。
Results from initial experiments show that an 8 ~ 24 degree LFSR can be formed by linking 1 ~ 7 degree LFSR's.
对于所有的实验电路，通过使用级数为确定性测试向量的确定位数量最大值的线性反馈移位寄存器，本策略可以编码所有的确定性测试向量。
For all benchmark circuits, the method is able to encode all deterministic test patterns using an LFSR whose size is equal to the maximum number of care bits in a test pattern.
对于所有的实验电路，通过使用级数为确定性测试向量的确定位数量最大值的线性反馈移位寄存器，本策略可以编码所有的确定性测试向量。
For all benchmark circuits, the method is able to encode all deterministic test patterns using an LFSR whose size is equal to the maximum number of care bits in a test pattern.
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