由于CMOS集成电路中的故障和制造缺陷是多种多样的，其中有些故障既不能被电压测试也不能被稳态电流测试方法检测出来。
Due to the diversity of the faults and manufacturing defects in CMOS IC, some of the faults can neither be defected by voltage test nor by IDDQ test.
测试电气和电子设备和组件的连续性，电流，电压和电阻。
Test electrical and electronic equipment and components for continuity, current, voltage and resistance.
在很多测试应用中，二极管的电压和发出的光可以利用大小固定的电流源同时测出来。
In many test applications, the voltage and light output of the diode can be measured simultaneously using a fixed source current value.
严格的质量监测工序，100%的电流和电压测试，确保组件符合功率要求。
Strict quality control procedure and tests for 100 percent current and voltage ensure the power requirement.
给出反偏电压、光谱响应、暗电流、极间电容、极间阻抗、位置分辨率和位置线性特性等性能的测试结果。
Several test results, such as reverse voltage, photo sensitivity, dark current, terminal capacitance, terminal impedance, position distinguishability, position Iinearity, were reported in the paper.
系统以DSP为控制核心，可自动识别并适应不同的电压和电流等级，采用程控放大、变化采样频率以获得优化的阵列测试效果。
The tester with DSP core could get excellent results by judging and adopting the different value of voltage and current, programmed amplifying and changing the frequency of sample.
在满足测试技术指标的前提下，能够完成对13种定时机构产品的电压、电流、时间和绝缘阻抗等性能的测试，取代了原有的13个不同的测试仪器。
While fulfilling the qualification of test technique, it can test the voltage, current, time and insulation impedance for 13 kinds of time mechanisms, and has replaced 13 primary test equipments.
在使用较大的电流时，这一点特别重要。因为和接点两端的电压降相比，测试引线两端的电压降可能会比较大。
This is especially important when higher currents are used because the voltage drop across the test leads may be large compared to the voltage drop across the contact.
测试电气和电子设备的连续性，电流，电压和电阻。
Test electrical and electronic equipment and components for continuity, current, voltage and resistance.
瞬态电流测试可以检测一些用电压测试和稳态电流测试不能检测的故障。
Dynamic current testing can detect some faults that cannot be detected by voltage based test method and quiescent current test method.
电磁脉冲的测试不仅包括对脉冲发生源的脉冲电流和脉冲电压的测试，还包括对脉冲辐射场的测试。
The measurement of electromagnetic pulse includes not only the pulse current and the pulse voltage of the source of the pulse, but also the radiation field.
基准源模块广泛的应用于模拟和混合电路中，如A/D、D/A转换器，电压调谐器，电压表，电流表等测试仪器以及偏置电路。
Reference sources are widely used in analog and mix-mode circuits, such as A/D, D/A converters, voltage regulators, measurements, instrumentation circuits, and bias circuits.
OLEDIV测试系统，是一套设计用以深入测试oled和有机太阳能电池功能性的设备，它拥有大驱动电压范围，以及高准确度的电流量测。
IV test System is designed for in-depth functionality testing of OLEDs and organic photovoltaics (OPVs). Broad voltage range and high current measurement accuracy.
利用一个由恒流脉冲发生器和数据采集卡组成的简单测试系统测得制冷器在小电流下的电阻电压和塞贝克电压，通过这两个电压推导出ZT值、最大制冷温差。
The resistance and Seebeck voltages used to calculate the ZT and the maximum temperature difference are measured using a testing system composed of a DC pulse generator and a DAQ card.
该系统主要有电流与电压关系测试、电压与电流关系测试、电阻与所加的脉冲信号关系的测试和疲劳特性测试等模块组成。
It includes several modules of the relationship between current and voltage, voltage and current, resistance and pulse width or height, fatigue characteristics.
对结发热最敏感的两种测试是正向电压测试和漏电流测试。
The two tests susceptible to junction heating are the forward voltage and leakage current tests.
所设计的电网参数测试仪可以测量功率因数、电压和电流的有效值、瞬时值等参数。
The tester designed can be used to measure the parameters, such as power factor, effective value of voltage and current, instantaneous value, etc.
这个标准包括定义的更新，额定电压和中断级别以及传送的电流和增温测试。
This standard includes updates to the definitions, voltage rating and interrupting rating tables, and the current carrying and temperature rise tests.
测试中的暂态过电压、暂态电流最大值均未超过设计和规程允许值。
Measurement results show that the maximum values of the measured transient voltages and currents have not excessed the designed values and allowable values specified in the standards.
测试中的暂态过电压、暂态电流最大值均未超过设计和规程允许值。
Measurement results show that the maximum values of the measured transient voltages and currents have not excessed the designed values and allowable values specified in the standards.
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