用X射线衍射分析的方法，通过精确测定点阵参数，对陶瓷颜料固溶体的固溶度进行了测定，并取得了满意的效果。
The solubility of the ceramic pigment was measured with an X-ray diffraction method by analyzing the crystal constant accurately.
采用电子探针及X射线衍射仪测定了可锻铸铁白口组织中硅的分布和硅对渗碳体点阵参数的影响。
The distribution of silicon in as-cast white iron was studied using electron probe microanalysis. Effect of silicon on lattice constant of the cementite was also studied using X-ray diffraction.
采用电子探针及X射线衍射仪测定了可锻铸铁白口组织中硅的分布和硅对渗碳体点阵参数的影响。
The distribution of silicon in as-cast white iron was studied using electron probe microanalysis. Effect of silicon on lattice constant of the cementite was also studied using X-ray diffraction.
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