泄漏电流是由测量电路和附近的电压源之间的寄生电阻通路产生的。
Leakage currents are generated by stray resistance paths between the measurement circuit and nearby voltage sources.
如果使用分离的电流源和电压表来进行低电阻测量，则必须检查每台仪器的非欧姆接触情况。
If using a separate current source and voltmeter to make low resistance measurements, each instrument must be checked for non-ohmic contacts.
在测量仪器上附加电流和电压源功能，为各种低电平测量应用提供了额外的灵活性。
Adding current and voltage sourcing capabilities to a measuring instrument provides an extra degree of versatility for many low level measurement applications.
切换和测量具有高内阻的电压源会受各种误差的影响，包括偏移电流、寄生漏泄通路，以及静电干扰。
Switching and measuring voltage sources with high internal impedance are subject to a number of errors, including offset currents, stray leakage paths, and electrostatic interference.
采用恒流法，可以使用静电计电压表和电流源或者只使用静电计欧姆计来测量高电阻。
High resistance measurements using the constant-current method may be made using either an electrometer voltmeter and current source or just an electrometer ohmmeter.
对于这种应用，单台仪器提供了电压源和小电流测量功能。
For this application, a single instrument provides both the voltage sourcing and the low current measurement functions.
这种方法和电流反向法类似，只是这种方法在固定的源电流和零电流之间交替进行测量。
This method is similar to the current-reversal method except that the measurements are alternated between a fixed source current and zero current.
噪声能够严重地影响灵敏的电流测量工作。本节讨论源电阻和源电容如何影响噪声的性能。
Noise can seriously affect sensitive current measurements. This section discusses how source resistance and source capacitance affect noise performance.
注意，这种测量方法是两线电阻测量，而使用静电计电压表和外部电流源则可以进行四线测量。
Notice that this is a two-wire resistance measurement compared to using the electrometer voltmeter and external current source, which can make a four-wire measurement.
在很多方面数字源表仪器与源-测量单元是类似的，包括电流和电压源，电流和电压测量以及扫描等性能。
The SourceMeter instrument is very similar to the source-measure unit in many ways, including its ability to source and measure both current and voltage and to perform sweeps.
该系统包括用来提供流过样品的电流的6220型电流源和用来测量产生的电压降的2182A型纳伏表。
The system includes a Model 6220 Current Source to supply the current through the sample and a Model 2182A Nanovoltmeter to measure the resulting voltage drop.
一旦将矩阵卡、源和测量装置组合连接在一起之后，就可能希望测量不同通路的偏移电流，从而来表征系统。
Once a given combination of matrix CARDS, sourcing, and measuring devices is put together, it may be desirable to measure the offset current for various pathways to characterize the system.
图4 -44示出一个基本的测量超导体电阻的测试系统。该系统使用2182a型纳伏表和6220型电流源来测量电阻。
Figure 4-44 shows a basic superconductor resistance measurement test system using the combination of a Model 2182a Nanovoltmeter and a Model 6220 Current Source for measuring the resistance.
对两种预电离源的放电电压和电流进行测量，得到瞬态信息。
The transient discharge voltage and current of the two pre ionization sources were measured also.
正如本书第一章所述，高源内阻的测量包括：低直流电压、弱直流电流、高电阻和电荷的测量。
As described in Section 1 of this handbook, measurements made from high resistance sources include low DC voltage, low DC current, high resistance, and charge measurements.
正如本书第一章所述，高源内阻的测量包括：低直流电压、弱直流电流、高电阻和电荷的测量。
As described in Section 1 of this handbook, measurements made from high resistance sources include low DC voltage, low DC current, high resistance, and charge measurements.
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