耦合到单个存储器的模式发生器操纵在并行测试方式过程中使用的并行测试矢量和在扫描测试方式过程中使用的并行和扫描测试矢量。
A pattern generator coupled to the single memory manipulates the parallel test vectors used during the parallel test mode and the parallel and scan test vectors used during the scan test mode.
耦合到单个存储器的模式发生器操纵在并行测试方式过程中使用的并行测试矢量和在扫描测试方式过程中使用的并行和扫描测试矢量。
A pattern generator coupled to the single memory manipulates the parallel test vectors used during the parallel test mode and the parallel and scan test vectors used during the scan test mode.
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