许多标称的探测深度都假定地层是具有特殊属性的均质地层(如假定地层的电导率或地层流体类型)。
Most quoted depths of investigation assume a homogeneous formation with certain properties, such as a given resistivity or fluid content.
许多标称的探测深度都假定地层是具有特殊属性的均质地层(如假定地层的电导率或地层流体类型)。
Most quoted depths of investigation assume a homogeneous formation with certain properties, such as a given resistivity or fluid content.
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