辐照改性层特性的超声无损表征为材料表面改性层质量评价提供了很好的途径。
The ultrasonic nondestructive characterization for irradiated coatings has contributed to the quality evaluation of modification layers of surface materials.
研制了一种用于大面积光学薄膜表面无损表征的新型原子力显微镜(afm)。
A novel large-stage atomic force microscope (AFM) for nondestructive characterization of optical thin films is built.
研制了一种用于大面积光学薄膜表面无损表征的新型原子力显微镜(afm)。
A novel large-stage atomic force microscope (AFM) for nondestructive characterization of optical thin films is built.
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