用原子力探针扫描电镜AFM等仪器对聚硅氧烷的膜形态及其排列方式作研究。
Morphology of functional polysiloxane film and their orientation on fiber have been observed and studied by an atomic force probe microscope (AFM) and other instruments.
采用全新的光路追踪方案与探针扫描方式，消除了测试过程中横向扫描和纵向反馈带来的误差，开放式的探头设计使液相操作更为便捷。
An innovative laser beam tracking system is proposed to eliminate the tracking and feedback errors. The open probe design of the AFM makes the operation in liquid convenient and easy.
测量中，把扫描隧道显微镜的探针扫描线作为参考栅，把物质原子晶格栅结构作为试件栅，对这两组栅线干涉形成的云纹进行了纳米级变形测量。
In the measurement, the moire pattern is generated by the scanning line of scanning tunneling microscope and the atomic lattice of substance as a specimen grating.
用荧光扫描器与分析软件逐个检测带有荧光的探针，识别显现出的细菌或病毒序列。
In turn, a fluorescent scanner and analysis software are used to detect the probes that have lit up, identifying the presence of viral or bacterial sequences.
提高作为纳米科技的“眼”和“手”的扫描探针显微镜(SPM)的测量和定位精度，是纳米仪器界始终追求的目标。
It is an objective for nanometer instrument researcher to improve the measurement precision of scanning probe microscope (SPM), the eye and hand of nanometer science and technology.
这些通常根据由手动操作的扫描杆连接的超声波探针和译码器确定的位置来绘制。
These often rely on the ultrasonic probe being connected to a manually operated scanning arm with the position being encoded.
两因素方差分析模型确定了随扫描日期调整的良恶性病变差异表达的探针。
A two-way ANOVA model identified probe sets with differential expression in malignant and benign lesions while adjusting for scan dates.
采用三维时间域有限差分（FDTD）方法研究了扫描近场光学显微镜中光纤微探针的近场分布特性。
The near field distribution of uncoated and metal coated fiber optic probes were characterized by the method of three dimensional finite difference time domain (FDTD).
一些其它系统是将探针连接安装在带有车轮的机架上来扫描。
Other systems incorporate a probe mounted in a housing with a wheel in contact with the article being scanned.
选用典型的二氧化钛纳米超亲水薄膜，用扫描探针显微镜(SPM)和电化学测试系统进行一般性的表征。
A typical nanostructured titania super hydrophilic film was chosen for general characterization employing a Scanning Probe Microscope (SPM) and an electrochemical measurement system.
扫描探针显微镜(SPM)当前的发展趋势是功能复合化和数字化。
A general trend of Scanning Probe Microscope (SPM) is to multiple functionality and digitalization.
针对法兰盘加工面上出现的黑纹缺陷，采用光学显微镜、扫描电镜和电子探针等测试方法对其进行了分析。
Analysis is made on the dark lines defects occurring over the working surface of flange by measurement with the optical microscope, Scanning electro microscope (SEM) and electronic probe.
近场光显微镜(NFOM)是一种高分辩率的扫描探针显微镜。
Near Field Optical Microscope (NFOM) is a kind of scanning probe microscopy with high resolution.
报道了对扫描探针电子能谱仪（SPEES）中俄歇电子出射的理论模拟研究。
The simulation of the Auger electron emissions in scanning probe electron energy spectrometer (SPEES) is reported.
探讨了外界激振对扫描探针显微镜(SPM)扫描图像的影响。
The influence of external vibration on scanned images of scanning probe microscope (SPM) is discussed.
电化学扫描探针显微镜(ECSPM)已成为研究固-液界面结构的有力的工具。
Electrochemical scanning probe microscopes (ECSPM) have become one of the most powerful techniques for studies of solid liquid interfaces.
利用扫描探针显微镜(SPM)能够实现纳米级电子器件和机械器件的加工。
Nanofabrication in electrical field by Scanning Probe Microscope (SPM) can fabricate electrical devices and mechanical structures in nanometer scale.
目前，我国引进的一般商业性的SPM(扫描探针显微镜)中缺少误差的自动修正和改进系统。
Up to now the imported commercial scanning probe microscope (SPM) has not an automatic error correcting and reducing system.
报道了我们自行搭建的扫描探针电子能谱仪的数据获取系统的物理实现。
The physical frame of a home-made data acquisition system of the scanning probe electron energy spectrometer (SPEES) was reported.
对扫描探针显微镜(SPM)仪器漂移的定量测量的几种方法进行探讨，提出应用二维零位标记进行漂移测量。
Several quantitative drift measurement techniques for scanning probe microscopy (SPM) were introduced. A new method using two-dimensional zero-reference masks was proposed to measure the SPM drift.
钨探针是扫描隧道显微镜（STM）常用探针之一。
Tungsten probe is one of the common probes used in scanning tunnel microscopy (STM).
扩散偶和合金样品采用光学显微镜、扫描电镜和电子探针显微分析技术进行分析。
Both the diffusion couple specimens and the alloys were examined by means of optical microscopy, scanning electron microscopy, and electron probe microanalysis.
扫描探针显微镜是近十几年来在表面特征、表面形貌观测方面最重大的进展之一，是纳米测量学的基本工具。
The scanning probe microscope is one of the most important developments on observing and determining surface topography and surface properties in near ten years and is basic tool of nano-measurement.
碳纳米管由于特殊的空间结构和突出的物理性能而广泛用于各类扫描探针显微镜。
Carbon nanotube has been expected to be a suitable material to the apex of scanning probe microscopy (SPM) tips because of its unique physical properties and special structures.
近场光学显微镜是利用探针的扫描来获得样品表面信息的。
Near-field optical microscopy, based on scanning sample surfaces by the tip of optical probe, obtained the imagined information about the object surface.
激光扫描共聚焦显微镜(LSCM)探测HMME和探针荧光图像。
The fluorescence images of HMME and probes are detected by LSCM.
本文主要介绍了扫描质子探针中微束核反应分析原理。
The principles and analytical technique of nuclear analysis of scanning microprobe (micro NRA) was introduced.
探针是所有扫描探针显微镜的关键部件。
Probe is a crucial part of all the scanning probe microscopes.
探针是所有扫描探针显微镜的关键部件。
Probe is a crucial part of all the scanning probe microscopes.
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