通过使用原子吸收光谱仪，扫描显微镜和能量色散X射线谱仪对覆膜光纤探针进行表征。
Atomic absorption spectrometry (AAS), scanning electron microscopy (SEM), and energy dispersive X-ray spectrometry (EDXS) are carried out to characterize the deposition on fiber probe.
利用该方法研制的成品弯曲光纤探针应用于光子扫描隧道显微镜系统，得到了比较理想的样品图像。
The bend optical fiber probe is used in developed NSOM system and the perfect images are obtained.
利用该方法研制的成品弯曲光纤探针应用于光子扫描隧道显微镜系统，得到了比较理想的样品图像。
The bend optical fiber probe is used in developed NSOM system and the perfect images are obtained.
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