• 提出荷兰微量元素X射线荧光光谱分析方法

    X-ray fluorescence spectrum method to analyse the trace elements in Dutch Red Celery was presented.

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  • 研究制定了X射线荧光光谱分析中适用多类型地质样品稀释比制技术。

    A sample preparation method with low dilution factor has been applied to the analysis of geological samples by X ray fluorescence spectrometry.

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  • 本文综述全反射x -射线荧光光谱分析进展、原理仪器应用参考文献67篇。

    The advances, principles, Instruments and applications of total reflection X-ray fluorescence spectrometry are reviewed with 67 references.

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  • X射线荧光光谱分析具有分析速度破坏样品组成、检测范围广结果稳定可靠优点

    X-ray fluorescence spectrometry has many good advantages such as quick analysis speed, no sample destruction, wide detection range and reliable results.

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  • 回顾我国X射线荧光光谱分析进展及其测试领域应用展望了今后的发展趋势

    This article reviews the progress and the application of X-ray fluorescence spectrometry in the field of rock and mineral analysis in China and surveys the development in the future.

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  • 大量数据论述硅铁试样制备过程环节X射线荧光光谱分析准确性影响规律制定硅铁试样的制备方法

    The article discusses regularity of all aspect affects X - ray spectrometer accuracy with a lot of datum during making Ferro Silicon, and formulates the method of making Ferro Silicon.

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  • X射线衍射、X射线荧光光谱分析、差热-热透射电镜分析方法对产品进行组成形貌粒径分析,获得了理想的结果

    The composition, appearance and grain size of dysprosium fluoride product have been characterized by XRD, TG, DTA, TEM and X-ray fluorescence analysis. The results show th...

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  • 评论收集了1982年至1986年6月国内主要分析刊物上发表200多篇文章,评述了在此期间我国X射线荧光光谱分析的概况与进展

    This review covers advance in the field of X-ray fluorescence spectrometry in Ching during beginning of 1982 to June of 1986.

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  • 并且通过IRTGA荧光光谱分析X -射线单晶衍射晶体结构性质进行表征研究

    And by IR, TGA, fluorescence spectroscopy and X-ray diffraction on the crystal structure and properties were characterized and studied.

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  • 荧光光谱分析表明,所得到薄膜材料紫外激发下发射出离子特征线

    The fluorescence spectra show that the thin film material emits the characteristic narrow band emission of Tb3 + ion under the UV excitation.

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  • 荧光光谱分析表明,所得到薄膜材料紫外激发下发射出离子特征线

    The fluorescence spectra show that the thin film material emits the characteristic narrow band emission of Tb3 + ion under the UV excitation.

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