超大规模集成电路(VLSI)中的参数成品率最优化问题一直是集成电路可制造性设计的重点研究问题。
The maximum problem of parametric yield in VLSI is always an important issue in design for manufacturing (DFM).
超大规模集成电路(VLSI)中的参数成品率最优化问题一直是集成电路可制造性设计的重点研究问题。
The maximum problem of parametric yield in VLSI is always an important issue in design for manufacturing (DFM).
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