基于固定型故障模型的测试方法已不能满足高性能集成电路，尤其是对CMOS电路的测试要求。
Testing based on stuck-at fault model is insufficient for high performance ICs, especially for CMOS circuits.
这种故障安全系统能够纠正单个冗余模块所产生的单固定型差错。
The single stuck-at error occurred in one redundant module can be corrected by the translator.
这种故障安全系统能够纠正单个冗余模块所产生的单固定型差错。
The single stuck-at error occurred in one redundant module can be corrected by the translator.
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