本文利用扩展电阻技术对半导体硅、硅基材料进行测试分析，从而用以开发新材料和评估材料的质量。
We use spreading Resistance technique to test and analyze silicon and silica base materials. This technique is more suitable to control material quality and develop new materials.
本文描述了使用共面微波探针的半导体芯片在片测试技术。
We present an on-wafer measurement technique of semiconductor wafer using special coplanar microwave probes.
将微电子测试结构与质量管理理论结合起来，运用于半导体技术，取得了初步结果。
And initial results have been obtained in the field of the application of combining microelectronic test structure with quality control theory to semiconductor technology.
这种测试仪在电子玻璃、半导体、集成电路、薄膜和纳米技术等领域都具有很大的应用前景。
This kind of tester has a enormous practical prospect in many fields, such as electronic glass, semiconductor, integrated circuit, thin films and technology of nanometer.
介绍了半导体器件与电路的总剂量辐射效应及其测试技术。
The measurements of total dose effects of electronic devices and circuits are presented in this paper.
本文介绍了CD-ROM半导体激光器P-I曲线的特殊测试技术、实验结果及其应用。
The special techniques and practical results of measurement and application of PI curves of LD for CDROM are presented in this paper.
该测试仪采用了一种新的光学测量方法，结合先进的半导体光电技术进行设计。
A new optical method and the advanced semiconductor photoelectric technology were used in this device.
该测试仪采用了一种新的光学测量方法，结合先进的半导体光电技术进行设计。
A new optical method and the advanced semiconductor photoelectric technology were used in this device.
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