平板显示器中有源元件的参数测试与其他各类半导体器件的IC器件测试相同。
Characterizing the active elements in flat panel displays is similar to IC device testing on other types of semiconductors.
平板显示器中有源元件的参数测试与其他各类半导体器件的IC器件测试相同。
Characterizing the active elements in flat panel displays is similar to IC device testing on other types of semiconductors.
应用推荐