差模辐射和共模辐射模型。
散热片与器件间的电容耦合是电路产生共模辐射的主要原因之一，其对研究电路的辐射发射特别重要。然而长期以来人们将该电容简化为平板电容，采用静电场推导的电容公式计算。
Coupling capacitance between the heatsink and the devices produces common mode emission, which is considered as a constant calculated by a equation resulting from the static field for a long time.
其测试诊断步骤依序为：传导发射测试、辐射辐射测试、共模电流测量和机箱泄漏检查。
The testing processes are testing of conductive transmit and radiant transmit, testing of common-mode current and detecting divulgation in turn.
本文根据电磁兼容优势效应理论，推导出双绞线传导干扰主要由差模电流引起，辐射干扰主要由共模电流引起。
Basing on dominant effect theory in EMC, conducted emi and radiated emissions of twisted-pair wires are mostly respectively due to differential-mode currents and common-mode currents.
为此根据电磁兼容优势效应理论，推导出双绞线传导干扰主要由差模电流引起，辐射干扰主要由共模电流引起。
Based on dominant effect theory in EMC, the conducted emi and radiated emissions of twisted-pair wires are mainly due to differential-mode currents and common-mode currents, respectively.
本文侧重研究了典型开关电源中的几种EMI形式，即传导干扰(包括差模和共模噪声)和辐射干扰。
This dissertation examines the different kinds of EMI in typical SMPS, namely conducted (differential and common mode) and radiated interferences.
本文侧重研究了典型开关电源中的几种EMI形式，即传导干扰(包括差模和共模噪声)和辐射干扰。
This dissertation examines the different kinds of EMI in typical SMPS, namely conducted (differential and common mode) and radiated interferences.
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