介绍了一种用于全反射法折射率测量的光学系统。
A new method was developed for measuring the refractive index based on total reflection.
光全反射法是测量真实接触面积的常用手段，然而用其测得的接触图像小，接触斑点的边界模糊。
Total reflection method has been commonly used to detect real contact area, however the boundary of the contact spots in the contact image obtained was vague.
本文介绍了衰减全反射法的基本原理、实验方法并将它应用于探测向列相液晶CP—9001LA的排列性质。
In this paper, the fundamental principle and the experiment method of ATR and the it's application in the analysis the aligning properties of the nematic liquid crystal CP 9001 LA arc introduced.
本文介绍了衰减全反射法的基本原理、实验方法并将它应用于探测向列相液晶CP—9001LA的排列性质。
In this paper, the fundamental principle and the experiment method of ATR and the it's application in the analysis the aligning properties of the nematic liquid crystal CP 9001 LA arc introduced.
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