薄膜光学所有的光学特性都是基于薄膜内光的干涉作用。
All the optical character of thin film is based on the interference of light inside.
结合激光外差干涉法和透射式椭偏测量原理，研究了一种快速、高精度测量纳米厚度薄膜光学参数的方法。
Based on the optical heterodyne interferometer and transmission ellipsometry, a new fast measurement technique of nanometer film was presented computational.
结合激光外差干涉术和反射式椭偏测量技术，设计了一种抗干扰能力强，快速、高精度测量纳米厚度薄膜光学参数的方法。
Optical heterodyne interferometry together with reflective ellipsometry, a fast measurement technology with high anti-interference performance was applied to nanometer film.
介绍了光波分复用器的工作原理，典型干涉膜型两波长光波分复用器器件结构原理及光学薄膜特性。
This article introduced the principle of WDM and the optical characters, proposed a novel structure of WDM.
本文搭建了一个用于精确测试光学薄膜位相特性的色散式白光频谱干涉仪。
A dispersive white-light spectral interferometer for precise measurements of the phase properties of multilayer thin film structures is built.
本文搭建了一个用于精确测试光学薄膜位相特性的色散式白光频谱干涉仪。
A dispersive white-light spectral interferometer for precise measurements of the phase properties of multilayer thin film structures is built.
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