此外,两种不同表面状态下的化学成分以及氧化层都通过二次离子质谱测定法进行了分析。
Additionally, chemical composition and thickness of oxide layers, occurring in both studied cases, were analyzed by secondary ion mass spectrometry.
此外,两种不同表面状态下的化学成分以及氧化层都通过二次离子质谱测定法进行了分析。
Additionally, chemical composition and thickness of oxide layers, occurring in both studied cases, were analyzed by secondary ion mass spectrometry.
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