这种成品率模型可以扩充到包含更复杂的备用电路系统的芯片。
This yield model can be extended to chips containing more complex redundant circuitry.
研究了基于微电子测试的双桥结构图形，功能成品率模型参数提取的优化方法。
Then, based on the double bridge test structure, an optimization method is presented which is used to extracting the parameters of yield model fast and effectively.
本文介绍了一种新颖的集成电路分档成品率的优化模型及求解。
A novel optimal model and its solving to the layer yield of IC's is presented.
利用关键面积的思想分析了冗余电路的成品率，并给出了其计算模型。
Yield of the redundant circuit is analyzed with IC critical area and the computational model of this redundant circuit is given.
建立了铸件成品率的数学模型，以实现铸件成品率的微机管理。
The mathematical model of finished product rate is developed in order to realize the microcomputer management of finished product rate.
对集成电路成品率的损失机理作了详细论述。最后，详细介绍了功能成品率的分析模型。
Mechanisms of the IC functional yield loss are discussed in particular and the analysis model of the IC functional yield is introduced in detail.
对集成电路成品率的损失机理作了详细论述。最后，详细介绍了功能成品率的分析模型。
Mechanisms of the IC functional yield loss are discussed in particular and the analysis model of the IC functional yield is introduced in detail.
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